MIC303: Short Wave InfraRed (SWIR) Microscopes
OEM SWIR industrial microscope (900 – 1700nm) to be integrated in an inspection tool.
Highlights:
High yield homogeneous bright field Kohler illumination.
Adjustable aperture and field stops.
Fiber Light Source.
Optional auxiliary port (laser, vibrometer, spectrometer).
Optional 2nd camera interface.
Applications:
Semiconductor (Front-End and Back-End)
PCB, FPD, solar cells, LEDs and MEMs
The mic303 can image details inside a Silicon Chip. By sliding ‘up’, the microscope is focused onto the outer surface, which was damaged by a laser beam (seen as a ‘crater’). However, by sliding ‘down’ the microscope is focused onto the internal chip which gradually shows a sharp image of the internal structure and the crater appears blurred and transparent
UP
Down
