MIC303: Short Wave InfraRed (SWIR) Microscopes

OEM SWIR industrial microscope (900 – 1700nm) to be integrated in an inspection tool.

Highlights:

High yield homogeneous bright field Kohler illumination.

Adjustable aperture and field stops.

Fiber Light Source.

Optional auxiliary port (laser, vibrometer, spectrometer).

Optional 2nd camera interface.

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applications

Applications:

Semiconductor (Front-End and Back-End)

PCB, FPD, solar cells, LEDs and MEMs

The mic303 can image details inside a Silicon Chip. By sliding ‘up’, the microscope is focused onto the outer surface, which was damaged by a laser beam (seen as a ‘crater’). However, by sliding ‘down’ the microscope is focused onto the internal chip which gradually shows a sharp image of the internal structure and the crater appears blurred and transparent

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