Microscope News

OMEK Introduces Large Format Inspection microscope

OMEK Optics, a leading designer and vendor of Inspection Microscopes has added a new 160mm Tube lens supporting Extremely Large sensors having Diagonal of up to 20mm. The new Tube lens covers a VIS-NIR band from 400nm to 1000nm. The large Format sensor (12 x 16mm) has an area which is 50% larger than one inch Format Sensors and over 200% larger than two-third Inch Format Sensors.

Metrology Microscope employing Large format sensors have increased throughput in Semiconductor wafer inspection and PCB Inspection.

The extremely wide light spectrum enables utilizing this new product at either the VIS or NIR bands.

For more information on the Large Format Sensor, please visit our inspection microscopes